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Figure 7
LEEM images at different electron energies and I(V) curves of graphene prepared in situ in the microscope chamber by annealing SiC up to 1550 K (Merino et al., 2013BB13). As can be seen, graphene regions of different thickness (namely single-, double- and triple-layer) have each a characteristic low-energy electron reflectivity curve. Regions with different graphene thickness can thus be distinguished in the LEEM images by their relative intensity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 745-752
https://doi.org/10.1107/S1600577515003537
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