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Figure 8
Dark-field LEEM image at 4.6 eV electron energy on one of the reconstruction beams of the clean Si(100)-2 × 1 surface (top) and line profile across several atomic steps. A 10 nm-wide bar is included in the profile graph as a guide to the eye. A line in the image indicates the profile direction.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 745-752
https://doi.org/10.1107/S1600577515003537
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