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Figure 9
Direct XPEEM and XMCD-PEEM images of permalloy nanostructures on a Si substrate: elemental and magnetic contrast. Profiles along the highlighted lines are shown below each graph including bars of 15 nm (left) and 20 nm (right) width, as guides to the eye. The measurements were made in remanence after magnetically saturating the sample. Due to shape anisotropy, all nanostructures are magnetized along their long axis. In the XMCD image, nanostructures with magnetization perpendicular to the X-ray incidence (indicated by a black arrow) are not visible while those with anti-parallel magnetization appear dark. For a review on magnetic nanostructures see Martín et al. (2003BB10).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 745-752
https://doi.org/10.1107/S1600577515003537
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