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Figure 2
(a) Diffraction pattern from a vertically oriented NRA measured at 500 eV and Des = 100 µm. The white rectangle indicates the area used for the analysis. (b) The Fourier transform of the NRA diffraction pattern. Both images are displayed on a logarithmic scale. (Inset) Optical microscope image of the NRA and its aperture separations shown in micrometers.

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SYNCHROTRON
RADIATION
ISSN: 1600-5775
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