view article
Figure 2
(a) Diffraction pattern from a vertically oriented NRA measured at 500 eV and Des = 100 µm. The white rectangle indicates the area used for the analysis. (b) The Fourier transform of the NRA diffraction pattern. Both images are displayed on a logarithmic scale. (Inset) Optical microscope image of the NRA and its aperture separations shown in micrometers.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 819-827
https://doi.org/10.1107/S1600577515005524
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS