Soft X-ray angle-resolved photoemission with micro-positioning techniques for metallic V2O3

Fujiwara, H.; Kiss, T.; Wakabayashi, Y.K.; Nishitani, Y.; Mori, T.; Nakata, Y.; Kitayama, S.; Fukushima, K.; Ikeda, S.; Fuchimoto, H.; Minowa, Y.; Mo, S.-K.; Denlinger, J.D.; Allen, J.W.; Metcalf, P.; Imai, M.; Yoshimura, K.; Suga, S.; Muro, T.; Sekiyama, A.

doi:10.1107/S1600577515003707

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Figure 4
Polar-angle dependence of ARPES recorded with 660 eV photons (a) and second derivative (b) for oriented V₂O₃ with (0001) plane. EDCs of (a) are shown in (c).

JOURNAL OF
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ISSN: 1600-5775

Volume 22| Part 3| May 2015| Pages 776-780

https://doi.org/10.1107/S1600577515003707

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