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Figure 1
Overview of the CXI instrument layout. Distances are indicated in meters from the 1 µm sample chamber (SC) and in parentheses for the 100 nm sample chamber. Each chamber is colored to match its corresponding KB pair. One set of Be lenses can be used to further control the focus in the 1 µm sample chamber and another set to refocus the unscattered beam to the serial sample chamber at 3.59. There are slits and diagnostic (S&D) along the beamline and a timing tool (TT) for fine timing between optical laser and X-ray beams for pump–probe experiments. The sample is located approximately 440 m downstream of the undulators.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 514-519
https://doi.org/10.1107/S160057751500449X
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