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![[Figure 1]](yi5004fig1mag.jpg)
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Figure 1
Overview of the XPP instrument layout. Distances are indicated in meters from the center of the diffractometer. S&D are slits and non-destructive intensity diagnostics, DCM is a large-offset double-crystal monochromator, CCM is a channel-cut monochromator, TT is a timetool measuring the arrival time of the optical laser in reference to the X-rays, M1 and M2 are silicon mirrors that can be used to deflect the beam in the vertical direction and can also provide harmonic rejection, L-IN is the laser in-coupling for the optical laser, D is a diagnostic. Components located downstream of the dashed line can be translated into the main LCLS line and allow the XPP instrument to take advantage of the full power and properties of the fundamental. The gray line is the LCLS main line, whereas the black one is offset 600 mm horizontally by the DCM. The sample at the XPP instrument is located approximately 200 m downstream of the undulators. |
![[Figure 1]](yi5004fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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