The X-ray Pump–Probe instrument at the Linac Coherent Light Source

Chollet, M.; Alonso-Mori, R.; Cammarata, M.; Damiani, D.; Defever, J.; Delor, J.T.; Feng, Y.; Glownia, J.M.; Langton, J.B.; Nelson, S.; Ramsey, K.; Robert, A.; Sikorski, M.; Song, S.; Stefanescu, D.; Srinivasan, V.; Zhu, D.; Lemke, H.T.; Fritz, D.M.

doi:10.1107/S1600577515005135

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Figure 2
Time-resolved normalized diffracted X-ray intensity for three superlattice reflections. The (−2 1/2 0) reflection is measured off resonance at 6.53 keV. The (0 −5/2 0) reflection is measured near resonance at 6.553 keV, and the (0 −3 0) reflection is measured on resonance at 6.555 keV. [Reprinted by permission from Macmillan Publishers Ltd: Beaudet al. (2014

). Nat. Mater. 13, 923–927, copyright (2014).]

JOURNAL OF
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RADIATION

ISSN: 1600-5775

Volume 22| Part 3| May 2015| Pages 503-507

https://doi.org/10.1107/S1600577515005135

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