Figure 6
(a) Speckle pattern produced by 150 nm silica particles at the XCS instrument. The color code shows intensity in ADU. X and Y axes define pixels position. The data were collected with the first ePix100 prototype camera at ∼7.5 m from the sample using 8.54 keV X-rays. Courtesy of Marcin Sikorski (LCLS, SLAC). (b) Spectrum showing the Ag-L line and the primary energy (7.5 keV). Data collected at SSRL with the first ePix100 prototype. |