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Figure 1
Overview of the XCS instrument layout. Distances are indicated in meters from the center of the diffractometer. S&D: slits and non-destructive intensity diagnostics; DCM: large-offset double-crystal monochromator; CCM: channel-cut monochromator; TT: time-tool measuring the arrival time of the optical laser with reference to the X-rays; M1/M2: silicon mirrors that can be used to deflect the beam in the vertical direction and can also provide harmonic rejection; L-IN: laser in-coupling for the optical laser. Components located downstream of the dashed line can be translated into the main LCLS line and allow the XCS instrument to take advantage of the full power and properties of the fundamental. The sample at the XCS instrument is located approximately 420 m from the source.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 3| May 2015| Pages 508-513
https://doi.org/10.1107/S1600577515004397
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