view article
Figure 11
(a) Profile of the deviatoric strain components [\varepsilon^{\rm{d}}_{{xx}}] and [\varepsilon^{\rm{d}}_{{zz}}] and (b) profile of the deviatoric stress components [\sigma^{\rm{d}}_{{xx}}] and [\sigma^{\rm{d}}_{{zz}}], obtained by the Laue-DIC method on a Si single-crystal during bending at 50 N. In (b), the line referring to as `FE' is the finite-element results for [\sigma^{\rm{d}}_{{xx}}] and [\sigma^{\rm{d}}_{{zz}}].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 4| July 2015| Pages 980-994
https://doi.org/10.1107/S1600577515005780
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS