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Figure 12
(a) Profile of the shear strain components [\varepsilon^{\rm{d}}_{{xy}}], [\varepsilon^{\rm{d}}_{{xz}}] and [\varepsilon^{\rm{d}}_{{yz}}] and (b) profile of the shear stress components [\sigma^{\rm{d}}_{{xy}}], [\sigma^{\rm{d}}_{{xz}}] and [\sigma^{\rm{d}}_{{yz}}] obtained by the Laue-DIC method for the Si single-crystal. Case 50 N.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 4| July 2015| Pages 980-994
https://doi.org/10.1107/S1600577515005780
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