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Figure 3
A Ge single-crystal is displaced along the incident X-ray beam for evaluating DIC accuracy for subpixel Laue spots displacements.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 4| July 2015| Pages 980-994
https://doi.org/10.1107/S1600577515005780
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