Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging

Li, Z.J.; Danilewsky, A.N.; Helfen, L.; Mikulik, P.; Haenschke, D.; Wittge, J.; Allen, D.; McNally, P.; Baumbach, T.

doi:10.1107/S1600577515009650

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 7
(a) Fitting of a rocking-curve profile with two pseudo-Voigt functions and one linear function in a pixel. (b) Plots of peak position shift of the two fitting functions along the blue profile line in Fig. 6

(b).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 4| July 2015| Pages 1083-1090

https://doi.org/10.1107/S1600577515009650

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page