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Figure 8
Instrumental resolution function (IRF) measured for a 2 µm × 2 µm KB mirror focused beam collected on an XRD 1621 from PerkinElmer at (a) 25.638 keV and (b) 42.720 keV as a function of sample-to-detector distance (SDD) using the CeO2 powder diffraction standard from NIST (674b) loosely filled into an empty gasket hole with a thickness of 0.03 mm. (c) Comparison of the IRF determined from the PerkinElmer XRD1621 and the Mar345 image plate as a function of different SDDs for the (200) and (422) reflections at an energy of 42.72 keV.

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