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Figure 5
Profile comparison between the true and retrieved phase shift of the second sample. The numbers on the figure (30, 50, 70 and 90) indicate the thickness of the respective features in the sample in nanometers.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 4| July 2015| Pages 1056-1061
https://doi.org/10.1107/S1600577515007699
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