Single-image phase retrieval using an edge illumination X-ray phase-contrast imaging setup

Diemoz, P.C.; Vittoria, F.A.; Hagen, C.K.; Endrizzi, M.; Coan, P.; Brun, E.; Wagner, U.H.; Rau, C.; Robinson, I.K.; Bravin, A.; Olivo, A.

doi:10.1107/S1600577515008978

Journal of Synchrotron Radiation Journal of
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Figure 2
(a) Mixed EI image, (b) retrieved thickness and (c) corresponding vertical profile for the 500 µm PET wire. (d) Mixed EI image, (e) retrieved thickness and (f) vertical profile of thickness for the 200 µm PEEK wire.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 4| July 2015| Pages 1072-1077

https://doi.org/10.1107/S1600577515008978

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