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Figure 9
Corrected and normalized XAS of 15 mM (n-pr Ni) at the calibrated energies, with uncertainties from some of the key systematics including dark current, variance of the repeated measurements with both the solvent and the solution, thickness ratio, background attenuation, scattering effect and harmonic contamination. Three to six aperture-dependent measurements were made at each of the energies and are in excellent agreement. The determined uncertainty underneath shows the quality of data signifying the measurement accuracy. High-accuracy XAS for (n-pr Ni) was also obtained for the lower path-length fraction (tfrac = 0.9804 ± 0.0006).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 4| July 2015| Pages 1008-1021
https://doi.org/10.1107/S1600577515006190
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