Optical design and multi-length-scale scanning spectro-microscopy possibilities at the Nanoscopium beamline of Synchrotron Soleil

Somogyi, A.; Medjoubi, K.; Baranton, G.; Le Roux, V.; Ribbens, M.; Polack, F.; Philippot, P.; Samama, J.-P.

doi:10.1107/S1600577515009364

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
(a) Measured vertical beam size at the position of the secondary source (SS) as a function of the pitch of the sagittally focusing M1 mirror. The smallest measured vertical beam size is ∼61 µm FWHM. (b) Variation of the vertical beam size as a function of the yaw of M1.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 4| July 2015| Pages 1118-1129

https://doi.org/10.1107/S1600577515009364

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