view article

Figure 6
Horizontal (a) and vertical (b) knife-edge scan measurements with the JTEC KB set-up at 16.7 keV energy and 20 µm × 20 µm SS slit opening. The σ standard deviation and the correlation coefficient (R) of the Gaussian fit of the first derivative, and the step-size are given. (c) Diffraction pattern (on logarithmic intensity scale) of a gold grating nanostructure measured with the XPAD pixel detector at 8.4 keV with a 20 µm × 20 µm SS slit opening at 2.5 m behind the sample.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds