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Figure 2
Movement of the glitch positions for different azimuthal angles. The labels show the variation of the angles during the experiment, which are calculated geometrically. The intensities of the X-rays are normalized to 1 and the offset of each line is 0.5. The black and red arrows indicate each set of glitch patterns belonging to the first and second crystals, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 5| September 2015| Pages 1147-1150
https://doi.org/10.1107/S1600577515012345
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