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Figure 1
Experimental set-up for quantitative single-exposure phase-contrast imaging using a random phase mask. Here X-rays from a source pass through a piece of sandpaper to produce a `reference' speckle pattern. The yellow dotted line represents an X-ray reaching the detector in the absence of any sample. A sphere is introduced downstream of the sandpaper and results in a change in the direction of propagation of the X-ray wavefront, shifting the pattern downstream, as represented by the yellow arrow. The transverse shift is represented here by Sx. The shift is also resolved into the y component Sy.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 5| September 2015| Pages 1279-1288
https://doi.org/10.1107/S1600577515011406
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