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![[Figure 2]](mo5116fig2mag.jpg)
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Figure 2
Differential shift images: (a) Sx(x, y) and (b) Sy(x, y). Here the sample comprises both glass and Perspex spheres ranging from 63 µm to 1.5 mm in diameter. The smallest feature size sandpaper is used in this figure, with a grain size of 15.3 µm, and the sample-to-detector distance is set at 75 cm. These differential shift images are calculated from the transverse shifts in speckle pattern that occur in the `reference and sample' image (c). The two differential shift images are then used to reconstruct a projected phase depth of the sample (d) which can also be shown as a three-dimensional surface plot (e). A comparison is made between the reconstructed quantitative phase depth and the theoretical phase depth by taking a profile of the reconstructed image (f). |
![[Figure 2]](mo5116fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
