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Figure 3
RMS error in recovered phase depth for eight pieces of sandpaper with different grain sizes ranging from 15.3 µm to 201 µm (red dots), together with a piece of paper towel or a piece of Reflex Ultra White A4 Paper as the analyzer (blue dots). The sample-to-detector distance was set at 75 cm. As mentioned in §4.1[link], the variation in RMS error was less than 0.2% for shifts of ten pixels relative to the aligned position. The error bars are less than 0.2% RMS error, which is smaller than the data points.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 5| September 2015| Pages 1279-1288
https://doi.org/10.1107/S1600577515011406
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