Influence of higher harmonics of the undulator in X-ray polarimetry and crystal monochromator design

Marx-Glowna, B.; Schulze, K.S.; Uschmann, I.; Kämpfer, T.; Weber, G.; Hahn, C.; Wille, H.-C.; Schlage, K.; Röhlsberger, R.; Förster, E.; Stöhlker, T.; Paulus, G.G.

doi:10.1107/S1600577515011510

Journal of Synchrotron Radiation Journal of
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Figure 3
Drawing of the analyzer crystal. The incident radiation from the polarizer crystal (green line) from the left is Compton scattered at 57° (red line) and then Bragg reflected from Si ( $[15,{\overline 5},{\overline 1}]$ ) to the detector.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 22| Part 5| September 2015| Pages 1151-1154

https://doi.org/10.1107/S1600577515011510

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