Origins of polarization-dependent anisotropic X-ray scattering from organic thin films

Gann, E.; Collins, B.A.; Tang, M.; Tumbleston, J.R.; Mukherjee, S.; Ade, H.

doi:10.1107/S1600577515019074

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Figure 2
Optical constants and materials contrasts. (a) Optical constants. Top: the real deviation from 1 ( $[\delta]$ ). Bottom: the imaginary part ( $[\beta]$ ) of the index of refraction (n = 1 − $[\delta]$ + $[i\beta]$ ), measured and calculated at different angles relative to the polarization axis of incident X-rays. The inset is a calculation of parallel and perpendicular $[\beta]$ for comparison and a drawing of the P3HT molecule. (b) Scattering contrasts calculated between different components in a P3HT PCBM film with molecular alignment of P3HT.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 1| January 2016| Pages 219-227

doi:10.1107/S1600577515019074

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