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Figure 1
(a, b) TEM and size distribution obtained for as-prepared (a) and annealed (b) Ge QDs. (c, d) Experimental and fitted magnitude of the Fourier transform of the EXAFS signal for the as-prepared (c) and annealed (d) sample. The data for diamond-type bulk Ge [measured at room temperature (RT)] are also given.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 253-259
doi:10.1107/S160057751501913X
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