ID16B: a hard X-ray nanoprobe beamline at the ESRF for nano-analysis

Martínez-Criado, G.; Villanova, J.; Tucoulou, R.; Salomon, D.; Suuronen, J.-P.; Labouré, S.; Guilloud, C.; Valls, V.; Barrett, R.; Gagliardini, E.; Dabin, Y.; Baker, R.; Bohic, S.; Cohen, C.; Morse, J.

doi:10.1107/S1600577515019839

Journal of Synchrotron Radiation Journal of
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Figure 5
Focused beam integral profiles taken at 29.6 keV in pink beam (a) and 29.6 keV in mono beam mode (b) by means of Au knife-edge scans. Solid circles represent the raw data and solid lines represent the respective fits.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 1| January 2016| Pages 344-352

https://doi.org/10.1107/S1600577515019839

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