The Time-resolved and Extreme-conditions XAS (TEXAS) facility at the European Synchrotron Radiation Facility: the energy-dispersive X-ray absorption spectroscopy beamline ID24

Pascarelli, S.; Mathon, O.; Mairs, T.; Kantor, I.; Agostini, G.; Strohm, C.; Pasternak, S.; Perrin, F.; Berruyer, G.; Chappelet, P.; Clavel, C.; Dominguez, M.C.

doi:10.1107/S160057751501783X

Journal of Synchrotron Radiation Journal of
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Figure 9
Left: schematic effect of X-ray penetration in a curved crystal. Right: simulation of the diffraction profile deformation of Si(111) crystal at 15 keV due to a 3 m radius of curvature.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 1| January 2016| Pages 353-368

https://doi.org/10.1107/S160057751501783X

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