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Figure 4
(a) AFM image (5 µm × 5 µm) of the GaAs epilayer grown on Si substrate, and (b) frequency distribution of the grain size obtained from the image analysis of AFM data.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 238-243
doi:10.1107/S1600577515019955
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