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Figure 1
Schematic of the undulator configuration at beamline I06 with polarimeter. The retarder/analyser tilt angles (θR/θA) are measured from the optical axis to the corresponding element surface and the retarder/analyser azimuthal angles (α/β) are measured from the vertical y axis.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 176-181
doi:10.1107/S1600577515021645
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