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Figure 2
Experimental setup. A focused monochromatic synchrotron X-ray beam was used to excite atoms in the sample. The emitted fluorescent radiation and its modulation due to interference were recorded with a pixel detector. The energy spectrum was monitored using a point detector. To increase the solid angle of the pattern detection, the detector assembly can be translated and rotated.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 214-218
doi:10.1107/S1600577515019037
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