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Figure 4
Kossel pattern of a NiO single-crystal. (a) Raw, unprocessed image shows barely visible lines. (b) The normalized, background eliminated and aligned images reveal an extended pattern about the threefold symmetry axis of the cubic structure. (c) Indexing the lines allows refinement of various structural and experimental parameters. (d) Kossel line profiles are extracted for several reflections as a function of the deviation from the Bragg angle. (e) Refinement of calculated Kossel line profiles yields 0 ± 10° phases for the structure factors.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 214-218
doi:10.1107/S1600577515019037
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