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Figure 12
Time-resolved X-ray diffraction from ultrafast laser-excited InSb. The two images are separated by 100 ps. The diffraction angle increases in the vertical direction, and this line shape could be analyzed to determine the depth-dependent strain profile. Here a simpler analysis is carried out by calculating the count rate difference as a function of laser/X-ray delay times (lower figure). Errors are estimated from the isolated dead-time model. Fitting the transient behavior to a double exponential (solid line) yields time constants of 0.8 ns and 100 ns, which may be used to estimate the longitudinal acoustic velocity and thermal diffusion speed of InSb.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 196-205
doi:10.1107/S1600577515018044
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