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Figure 7
Detector testing configuration behind the diffractometer. A variety of samples, including polyimide film (shown), fluorescence targets and an InSb wafer for diffraction studies, were placed at the diffractometer center. The PAD is centered in the circuit board. We have since packaged the detector in a more flexible electronic enclosure.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 196-205
doi:10.1107/S1600577515018044
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