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Figure 1
Specular X-ray reflectivity as a function of the incidence angle for Au, B4C, Mo and Rh coatings. The scans were performed using Cu radiation (8048 eV). The results from IMD simulations are also indicated. The linear plot shows that the critical angle is higher when the film density is increased. The logarithmic scale of the insert depicts thickness oscillations (Kiessig oscillations). The distance between the maxima is smaller for thicker films.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 50-58
doi:10.1107/S1600577515020901
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