The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II

Schäfers, F.; Bischoff, P.; Eggenstein, F.; Erko, A.; Gaupp, A.; Künstner, S.; Mast, M.; Schmidt, J.-S.; Senf, F.; Siewert, F.; Sokolov, A.; Zeschke, T.

doi:10.1107/S1600577515020615

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 17
Two-dimensional maps of the reflected intensity (in-plane versus off-plane detector angle) of a reflection zone plate recently produced at HZB for the UV-range before (a) and after (b) yaw-alignment.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 1| January 2016| Pages 67-77

doi:10.1107/S1600577515020615

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