view article
Figure 7
The finally integrated mirror onto the back plane, being aligned under the long trace profilometer at INAF/OAB in order to measure the deformation imparted by piezoelectric patches when fed by a voltage.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 59-66
doi:10.1107/S1600577515017142
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS