view article
Figure 2
Grazing-incidence X-ray diffraction pattern of a ternaphthalene thin film on an isotropic silicon oxide surface recorded at αi = 0.15°; intensities are plotted on a logarithmic color scale. The peaks A and A′ represent the components of the split 110 Bragg peak. The inset gives the chemical structure of the molecule.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 3| May 2016| Pages 729-734
doi:10.1107/S1600577516003672
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS