Sapphire hard X-ray Fabry–Perot resonators for synchrotron experiments

Tsai, Y.-W.; Wu, Y.-H.; Chang, Y.-Y.; Liu, W.-C.; Liu, H.-L.; Chu, C.-H.; Chen, P.-C.; Lin, P.-T.; Fu, C.-C.; Chang, S.-L.

doi:10.1107/S1600577516004999

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 2
Topographic images of (a) the sapphire wafer grown using the Kyropoulos method (crystal thickness 0.423 mm) and (b) the optical grade sapphire wafer grown using the heat exchanger method (crystal thickness 1.0 mm).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 3| May 2016| Pages 658-664

doi:10.1107/S1600577516004999

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