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Figure 2
Topographic images of (a) the sapphire wafer grown using the Kyropoulos method (crystal thickness 0.423 mm) and (b) the optical grade sapphire wafer grown using the heat exchanger method (crystal thickness 1.0 mm).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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