Time- and spatial-resolved XAFS spectroscopy in a single shot: new analytical possibilities for in situ material characterization

Buzanich, A..G; Radtke, M.; Reinholz, U.; Riesemeier, H.; Emmerling, F.

doi:10.1107/S1600577516003969

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
Graphical representation of the photon flux obtained by the `band-pass' between DMM as mirror and a 60 µm-thick Al filter. For the EXAFS measurements of Cu-K, a total photon flux of 1.5 × 10¹³ photons s⁻¹ is obtained.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 3| May 2016| Pages 769-776

doi:10.1107/S1600577516003969

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