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Figure 7
Single-shot EXAFS on a 12.5 µm-thick Cu foil in 6 s. (a) Intensity pattern corrected to the flat-field. (b) Intensity pattern of the division of two measurements of the flat-field. (c) EXAFS profile obtained from the whole illuminated area (1024 × 62 pixels). (d) Respective consistency with the average close to unity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 3| May 2016| Pages 769-776
doi:10.1107/S1600577516003969
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