Polarized hard X-ray photoemission system with micro-positioning technique for probing ground-state symmetry of strongly correlated materials

Fujiwara, H.; Naimen, S.; Higashiya, A.; Kanai, Y.; Yomosa, H.; Yamagami, K.; Kiss, T.; Kadono, T.; Imada, S.; Yamasaki, A.; Takase, K.; Otsuka, S.; Shimizu, T.; Shingubara, S.; Suga, S.; Yabashi, M.; Tamasaku, K.; Ishikawa, T.; Sekiyama, A.

doi:10.1107/S1600577516003003

Journal of Synchrotron Radiation Journal of
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Figure 2
Offset angle dependence of the photon intensities relative to the diamond (220) Bragg reflections for the first (a) and second (b) diamond. The evaluated degree of linear polarization P_L is also plotted at the bottom of (a) and (b).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 3| May 2016| Pages 735-742

https://doi.org/10.1107/S1600577516003003

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