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Figure 6
Co-axial microscope image of the fractured surface of YbB12 (a), of the fluorescence-powder reference on the gold reference on the manipulator (b), and of the evaporated Pt marker on NiO film (c). The X-ray beam spot is located at the intersection of the cross-lines. (d) Schematic image of the square- and line-shaped Pt marker for defining specific regions on the NiO. The positions measured by HAXPES are also indicated on the Pt marker (1), as-grown NiO film (2) and the voltage-applied region on NiO (3). (e) Schematic view of the setup for applying the voltage on the NiO film by Pt point contact outside the photoemission chamber, and (f) the experimental geometry of the HAXPES measurement.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 3| May 2016| Pages 735-742
https://doi.org/10.1107/S1600577516003003
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