Implementation of ultrafast X-ray diffraction at the 1W2B wiggler beamline of Beijing Synchrotron Radiation Facility

Sun, D.-R.; Xu, G.-L.; Zhang, B.-B.; Du, X.-Y.; Wang, H.; Li, Q.-J.; Zhou, Y.-F.; Li, Z.-J.; Zhang, Y.; He, J.; Yue, J.-H.; Lei, G.; Tao, Y.

doi:10.1107/S1600577516004252

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Figure 5
(a) Intensity and profile consistence between the gated and the non-gated BFO signal. Black: gated signal intensity at 1 kHz, 10 ns gate width, 30 s exposure, signal multiplied by a factor of 2.2. Red: non-gated signal, 0.01 s exposure with X-ray attenuation by 30 times. Inset: gated diffraction peaks of BFO (002) and substrate recorded simultaneously. (b) Rocking curves of BFO (002) peak before (Δt < 0) (black) and after (Δt = 200 ps) (red) laser excitation at 1.8 mJ cm⁻² fluence.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 23| Part 3| May 2016| Pages 830-835

doi:10.1107/S1600577516004252

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