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Figure 6
Average thickness distributions computed using the image processing pipeline for (a) Al and (b) Ni phases. The resulting distributions from both FIB/S&V and X-ray nanotomography characterization techniques are compared.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 4| July 2016| Pages 990-996
doi:10.1107/S1600577516007992
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