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Figure 6
Average thickness distributions computed using the image processing pipeline for (a) Al and (b) Ni phases. The resulting distributions from both FIB/S&V and X-ray nanotomography characterization techniques are compared. |
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Figure 6
Average thickness distributions computed using the image processing pipeline for (a) Al and (b) Ni phases. The resulting distributions from both FIB/S&V and X-ray nanotomography characterization techniques are compared. |