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Figure 7
Simulated beam divergences using a typical scattering source size for RIXS measurements [10 µm × 40 µm (V × H)] and measured mirror surface profiles (cf. Fig. 3 ![]() |
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Figure 7
Simulated beam divergences using a typical scattering source size for RIXS measurements [10 µm × 40 µm (V × H)] and measured mirror surface profiles (cf. Fig. 3 ![]() |