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Figure 7
Preparation of standard specimens of metal particles. (a) SEM image of dispersed copper-oxide particles (left panel), and a diffraction pattern from a single copper-oxide particle of approximate size 500 nm. The electron density map projected along the direction of the incident X-ray pulse is retrieved as shown in the inset. We applied the ASURA protocol to the diffraction pattern up to a resolution of 25 nm at edge (Table 1 ![]() |