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Figure 3
Available gradient for a standard Apple undulator as a function of the undulator field parameter on-axis. The gradient is obtained by shifting longitudinally the arrays of the Apple device. The different lines define areas with a certain level of field linearity, defined as the maximum deviation of the gradient in a region of ±1 mm with respect to the on-axis gradient. For instance, for K0 = 1, we can obtain a gradient between 30 and 150 m−1 with a linearity better than 20% (see text for more details).

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