view article
Figure 10
Batch analysis results of a NiTi sample subjected to high-rate tensile loading (undulator gap 20 mm, frame rate 20 kHz, exposure time 5 µs). (a) 1D diffraction intensity stack-up. (b) 2D graph showing the diffraction intensity change as a function of frame number (or time delay). (c) Smoothed 2D intensity graph providing a better visualization effect.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 4| July 2016| Pages 1046-1053
https://doi.org/10.1107/S1600577516005804
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS